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Universal Reflectance Measurements
The ReflectaScan Reflectance Spectrophotometer is designed as a universal reflectance measuring instrument capable of scanning samples over the wavelength range 190-
Diffuse Reflectance Measurements
The integrating sphere system allows a range of measurements to be made.
The compact integrating sphere, which mounts within the instrument's sample compartment, is made from SpectralonTM which has the highest reflectance over the UV and visible region of any known substance. This gives high energy throughput resulting in excellent performance. The design is versatile, easy to use and allows for the elimination of substitution errors.
A 0° sample rest enables measurements to be carried out with the specular component eliminated. Substituted by a 11° sample rest, total hemispherical reflectance is measured.
A dedicated high performance SpectralonTM integrating sphere is used for diffuse reflectance and diffuse transmittance measurements. The sphere unit has its own silicon diode detector which uses a separate signal channel within the Spectrophotometer.
Turbid or Scattering Samples
The sphere unit is equipped with a 10mm pathlength cuvette holder so that transmittance measurements may be made for both turbid or normal samples. Scattering films may also be accommodated for measurement.
A dedicated specular reflectance unit is used for specular reflectance measurements of surfaces and coated opthalmic lenses. The unit is ideal for quality assurance in the production of anti-
Diffuse Reflectance of Samples
A scan is shown here of a poppy coloured paint sample from the Dulux paint range and also an overlay of scans for two blue paint samples each specified by its British Standard number shown on the chart.
Below is the reflectance scan of a plain white copy paper which shows a good flat response over the visible region, with fluorescence stimulated by UV radiation showing in the short wavelength region, but the origin of which is of longer wavelength.
All scans were made with the specular component excluded.
Coated Lens Reflectance
The optical performance of the anti-
Opthalmic Lens Transmission
The transmission characteristics of tinted opthalmic lenses may readily be measured using the CE 3077 lens mounting system. This allows the lens to be accurately centred on a carrier plate which is kinematically mounted on the body of the lens holder.
Measurement of Thin Films
Using the CE 3075 specular reflectance unit, the thickness of films deposited on a surface, for instance a epitaxial film of silicon dioxide on a silicon wafer, is readily measured.
The reflectance scan of such a film against wavelength produces a series of transmission maxima and minima due to the interference between energy reflected from the front surface of the film and that reflected from the interface between the film and its substrate.
Film thickness is calculated from an equation relating the number of peaks to their wavelength separation. Alternatively, ColourScan software may be used for automatic calculations. Films down to about 0.1 microns in thickness may be measured.
A scan of a deposited film is shown here, the film thickness was calculated to be 1.05 microns.
Software is available (ColourScan), to enable a wide range of automatic calculations including tristimulus values, chromaticity, CIE L* A* B, CIE L* U* V, Hunter, metric colour, whiteness and yellowness.
Standard illuminant tables include CIE, A, B & C and CIE D50, D65 & D75. Observer tables include 2° and 10° angles.
Shown here is part of a complete printout from a light blue paint sample produced by the colour software programme.
Automatic Colour Measurements
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